Name: Dual-Head High-Frequency IC Test Probe YF DE1-051DF57-01C0
Brand: SICHUAN WINNER SPECIAL ELECTRONIC MATERIALS CO., LTD.
Price: 999 USD
Availability: InStock

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Dual-Head High-Frequency IC Test Probe YF DE1-051DF57-01C0

Dual-head IC test probe

High-frequency spring test probe

YF DE1 test probe

Tempat asal:

Cina

Nama merek:

WINNER

Sertifikasi:

ISO9100

Hubungi Kami

Minta Kutipan

Dual-Head High-Frequency IC Test Probe YF DE1-051DF57-01C0

Rincian produk

Nama Produk:

probe uji pegas

barel:

PB, Palpal Emas

Plunger Bawah:

BeCu/SK4, berlapis emas

Pendorong ATAS:

SK4(Menjadi Cu)/Berlapis Emas

MUSIM SEMI:

SWPB(SUS)/Berlapis Emas

Tersedianya:

Ukuran khusus tersedia

Lapisan:

Berlapis emas

Peringkat Saat Ini:

Hubungi Resistensi:

maks 100 mohm

Bandwidth:

-0,85dB @ 19,6GHz

induktansi:

1,27nH

Kapten:

1,62pF

Stroke penuh:

1.0mm

Stroke berperingkat:

0,65mm

Angkatan Musim Semi:

25gram@0.65mm

Kehidupan Mekanik Melebihi:

200k

Menyoroti:

Dual-head IC test probe

High-frequency spring test probe

YF DE1 test probe

Syarat Pembayaran & Pengiriman

Kuantitas min Order

3000pcs

Harga

999

Kemasan rincian

Pengepakan netrial atau dengan logo OEM

Waktu pengiriman

5-8 hari kerja

Syarat-syarat pembayaran

L/C, Western Union, T/T

Menyediakan kemampuan

100000 gulungan per bulan

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Deskripsi Produk

High Quality Switch Contact Pin Test Probe YF DE1-051DF57-01C0

Precision spring-loaded semiconductor test pins designed for reliable performance in demanding testing applications, featuring high efficiency BGA testing capabilities.

Key Product Features

High Conductivity Gold Plating: Gold-plated plunger and barrel ensure low contact resistance and stable signal transmission
Multiple Tip Styles: Available in B tip (60° cone), U tip, D tip, and fully customized geometries
Durable Spring Structure: Stainless steel spring (SUS material) provides stable working stroke and reliable contact force
Custom Manufacturing: OEM/ODM accepted with fast delivery from our factory

Product Images

Detailed Component Illustration

Comparison of different test probe tip types and configurations

Customization Options

SICHUAN WINNER SPECIAL ELECTRONIC MATERIALS CO., LTD. offers comprehensive customization for our brass barrel stainless steel spring test probes:

Custom diameters to match your specific requirements
Custom plating thicknesses for optimal conductivity and durability
Custom mechanical specifications tailored to your application

All products include material traceability documentation and certificate of analysis for quality assurance. Contact us to request samples or a quotation for your specific application requirements.

Manufacturing Process

Our probe manufacturing facility

Quality control inspection

Packaged probes ready for shipment

Tag：

Dual-Head High-Frequency IC Test Probe YF DE1-051DF57-01C0

Dual-head IC test probe

High-frequency spring test probe

YF DE1 test probe

Dual-head IC test probe

High-frequency spring test probe

YF DE1 test probe

High Quality Brass Spring Loaded 4 Pin PCB Contact Pin for Electronic Device

Double-head Test Probe Spring Contact Pin for IC Testing YOUFU UF-FTO55FD030-002

Gold Plated Spring Test Probe with 2A Current Rating and Custom Sizes for PCB Testing

Gold Plated Spring Test Probe with 2A Current Rating and Custom Sizes for IC Testing

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